Produkty dla oscyloskop dla kanap (10)

O342e - Analizator Ozonu

O342e - Analizator Ozonu

QAL1-zertifizierter und US-EPA-zugelassener UV-photometrischer Ozon-Analysator für exakte, stabile und reproduzierbare O3-Messungen im Bereich von 0-500 ppb oder 0-10 ppm. Messgröße:O3 Technologie:UV Fotometrie & LED QAL1 Zertifizierung:Ja US-EPA Zulassung:Ja Messbereiche:0-1 ppm / 0-10 ppm Messeinheiten:ppb, ppm, µg/m3 (benutzerdefiniert) Untere Nachweisgrenze (2σ):0.2 ppb Rauschen (σ) :0.1 ppb
Przenośny spektrofotometr CM-700d

Przenośny spektrofotometr CM-700d

Portables Spektralphotometer mit Kugelgeometrie und vertikaler Bauform
Cyfrowy Projektor Pomiarowy

Cyfrowy Projektor Pomiarowy

Wichtig um eine gute Messung zu erhalten, sollte das Werkstück möglichst sauber sein und keine Gratbildung haben. Dimensionsmesstechnik: Profilprojektor / Messmikroskop / Optisches Koordinatenmesssystem / Messschieber und Bügelmessschrauber / Konturenmessgerät
CONFOCHECK - system FTIR

CONFOCHECK - system FTIR

The CONFOCHECK is a dedicated FTIR system for the investigation of proteins in water. Its specific configuration facilitates a fast data acquisition (ca. 30 sec. per sample) with a high sample throughput controlled by an extremely user-friendly software interface. FTIR Protein Applications Protein quantification Detection of conformational changes Protein dynamics (temperature induced conformational changes) Monitoring of conformational changes during protein aggregation, precipitation and crystallization Determination of the secondary structure Quantification of all kind of solutes in aqueous samples (buffers, excipients, detergents) Typical Applications in Pharma: Pre-formulation and formulation development: Analysis of the influence of the formulation on protein stability Stability studies (stress tests): Influence of pH, temperature, mutation, etc. on the protein stability
Miernik Napięcia Powierzchniowego

Miernik Napięcia Powierzchniowego

Oberflächenspannungsprüfgerät
SEOS 02 Spektrometr Emisji Optycznej - Spektrometr emisji optycznej do analizy metali i stopów

SEOS 02 Spektrometr Emisji Optycznej - Spektrometr emisji optycznej do analizy metali i stopów

SE0S 02 is the best solution for the customers, who need quick analysis, high specifications, safety and fair accuracy of element composition identification results in metal production at minimal purchase, commission and operating of the device costs. Applications: - Industrial analytical laboratories of metallurgical and machine-building factories; - Express analysis of alloys while melting at workshops; - Identification of alloy grade at warehouses; - Research institutes and universities. SEOS 02 identifies the composition of iron alloys (all types of steel and cast iron) and nonferrous alloys on any basis (Al, Cu, Zn, Ni, Ti, Mg, Co, Pb, etc.). CCD allows to analyze the whole range of basic elements used in metallurgy, including S, P, C. SEOS 02 measurement accuracy is in accordance with international regulatory documents. Every SEOS 02 spectrometer passes the state verification procedure as a measuring instrument. Ambient temperature:10-35 °C Atmospheric pressure:84-106,7 kPa (630-800 mm Hg) Relative humidity (at T=25 °C ):≤ 80% Electrical power:220 V, (50±2) Hz Length, mm:≤ 690 Width, mm:≤ 510 Height, mm:≤ 400 Weight, kg:≤ 50
Mikroskop pomiarowy MS1

Mikroskop pomiarowy MS1

Valuable, portable measuring microscope with integrated coaxial and angular incident illumination. steady, anodized aluminium body focussing by knurled ring and fine-pitch thread transformer with LED or battery LED lamp Magnifications:20x tos 800x Fields of view:8.9 mm to 0.35 mm Measurement range:Z 8 mm
Urządzenie do pomiaru kąta Synchro / Resolver SWMG / RWMG

Urządzenie do pomiaru kąta Synchro / Resolver SWMG / RWMG

Das SWMG / RWMG erfasst die Winkelposition eines angeschlossenen Synchro oder Resolver, zeigt den Winkel mit einer Auflösung von 0,1° an und stellt die gemessenen Werte auf analogen und digitalen Ausgabekanälen zur Verfügung. Die Erregerspannung für die Winkelgeber kann von einem internen Generator bereitgestellt, oder auch extern eingeschleift werden. Des weiteren besteht die Möglichkeit, ein externes Differential-Synchro bzw. Resolver in den Signalweg zu schleifen, um den gemessenen Ist-Winkel um einen konstanten Wert zu verändern.
Optocontrol 2520 - Optyczny mikrometr precyzyjny

Optocontrol 2520 - Optyczny mikrometr precyzyjny

The optoCONTROL 2520 is a compact laser micrometer with integrated controller. A high resolution, model variant with measuring ranges of 46 mm and 95 mm as well as variable mounting distances allow a wide range of applications in quality monitoring and production control. The measurement object can be placed at any position within the light curtain and the distance from transmitter to receiver can be freely selected.
Niestandardowy system pozycjonowania z podstawą do mikroskopu OEM

Niestandardowy system pozycjonowania z podstawą do mikroskopu OEM

stable granite and iron cast stand with manual z-adjustment high performance stepper motion controller with joystick and serial interface XY Stage GT8, Rotary Stage RT5, Wafer-Chuck WC6 precise xy stage GT8 with 200 x 200 mm stroke rotary stage RT5 with high round- and flat runout below 5 µm wafer-chuck WC6 for 4-12" wafer wafer-chuck with vacuum-fixture for 12", 10", 8", 6" and 4" wafer